Topographical characterization of electrodeposited nickel nanoparticles on an Indium Tin Oxide on glass thin film

Gerardo T. Martinez, Genaro Zavala, Marcelo Videa

Resultado de la investigación: Contribución a los tipos de informe/libroContribución a la conferenciarevisión exhaustiva

Resumen

Topographical characterization of electrodeposited nickel nanoparticles was carried out by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The particles showed a hemispherical growth, typical from a Volmer-Weber growth mechanism. However, they presented different morphology and crystallization types under similar electrochemical conditions. Preferential growth on determined sites on the substrate surface at different electrochemical conditions was also studied, showing that the particle growth strongly depends on the competition of different electrochemical processes, such as Hydrogen Evolution Reaction (HER), which are promoted preferably by the pulse intensity.

Idioma originalInglés
Título de la publicación alojadaAdvanced Electron Microscopy and Nanomaterials
EditorialTrans Tech Publications Ltd
Páginas65-68
Número de páginas4
ISBN (versión impresa)087849281X, 9780878492817
DOI
EstadoPublicada - 2010
Evento1st Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials, AEM-NANOMAT'09 - Saltillo, Coahuila, México
Duración: 29 sep 20092 oct 2009

Serie de la publicación

NombreMaterials Science Forum
Volumen644
ISSN (versión impresa)0255-5476
ISSN (versión digital)1662-9752

Otros

Otros1st Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials, AEM-NANOMAT'09
País/TerritorioMéxico
CiudadSaltillo, Coahuila
Período29/09/092/10/09

Áreas temáticas de ASJC Scopus

  • Ciencia de los materiales (todo)
  • Física de la materia condensada
  • Mecánica de materiales
  • Ingeniería mecánica

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