Message from the international workshop on Quality and Measurement of Software Model-Driven Developments (QUAMES) Chairs

Beatriz Marín, Alain Abran, José Luis De La Vara, Giovanni Giachetti

Resultado de la investigación: Contribución a una revista › Editorial › revisión exhaustiva

Idioma original	Inglés
Número de artículo	6605902
Páginas (desde-hasta)	21
Número de páginas	1
Publicación	Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
DOI	https://doi.org/10.1109/QSIC.2013.12
Estado	Publicada - 2013
Evento	13th International Conference on Quality Software, QSIC 2013 - Nanjing, Jiangsu, China Duración: 29 jul. 2013 → 30 jul. 2013

Áreas temáticas de ASJC Scopus

@article{39ed65bdc9be48feb8209c433094721d,

title = "Message from the international workshop on Quality and Measurement of Software Model-Driven Developments (QUAMES) Chairs",

author = "Beatriz Mar{\'i}n and Alain Abran and {De La Vara}, {Jos{\'e} Luis} and Giovanni Giachetti",

year = "2013",

doi = "10.1109/QSIC.2013.12",

language = "English",

pages = "21",

journal = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",

note = "13th International Conference on Quality Software, QSIC 2013 ; Conference date: 29-07-2013 Through 30-07-2013",

}

Resultado de la investigación: Contribución a una revista › Editorial › revisión exhaustiva

TY - JOUR

T1 - Message from the international workshop on Quality and Measurement of Software Model-Driven Developments (QUAMES) Chairs

AU - Marín, Beatriz

AU - Abran, Alain

AU - De La Vara, José Luis

AU - Giachetti, Giovanni

PY - 2013

Y1 - 2013

UR - http://www.scopus.com/inward/record.url?scp=84885642326&partnerID=8YFLogxK

U2 - 10.1109/QSIC.2013.12

DO - 10.1109/QSIC.2013.12

M3 - Editorial

AN - SCOPUS:84885642326

SP - 21

JO - Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

JF - Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

M1 - 6605902

T2 - 13th International Conference on Quality Software, QSIC 2013

Y2 - 29 July 2013 through 30 July 2013

ER -