Ion emission study using visible spectroscopy and ToF method in a plasma focus device of two kilojoules

J. Moreno, D. Morales, G. Avaria, O. Cuadrado, L. Soto

Resultado de la investigación: Article

Resumen

Different studies have been developed in order to understand the dynamics and processes involved in the particle emission from plasma focus devices operating in the kilojoule range. The use of chemical compound gasses and noble gas mixtures has proven to produce different charged particles, as well as increase the neutron yield from deuterium plasma discharges. Nevertheless, the processes and parameters involved in these discharges are not fully understood. In this work we will present results of visible spectroscopy and "time-of- flight" observations of the different ion species and ionization levels obtained in a 2kJ plasma focus device, when using deuterium or hydrogen with small percentage impurities.

Idioma originalEnglish
Número de artículo012023
PublicaciónJournal of Physics: Conference Series
Volumen591
N.º1
DOI
EstadoPublished - 1 ene 2015
Publicado de forma externa

Huella dactilar

plasma focus
ion emission
deuterium plasma
chemical compounds
particle emission
plasma jets
spectroscopy
gas mixtures
deuterium
rare gases
charged particles
neutrons
ionization
impurities
hydrogen
gases
ions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Citar esto

Moreno, J. ; Morales, D. ; Avaria, G. ; Cuadrado, O. ; Soto, L. / Ion emission study using visible spectroscopy and ToF method in a plasma focus device of two kilojoules. En: Journal of Physics: Conference Series. 2015 ; Vol. 591, N.º 1.
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Ion emission study using visible spectroscopy and ToF method in a plasma focus device of two kilojoules. / Moreno, J.; Morales, D.; Avaria, G.; Cuadrado, O.; Soto, L.

En: Journal of Physics: Conference Series, Vol. 591, N.º 1, 012023, 01.01.2015.

Resultado de la investigación: Article

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AU - Cuadrado, O.

AU - Soto, L.

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