Resumen
We present the results of a combined study of the defect structure and residual stress in a diamond layer, grown by PECVD on a polycrystalline copper substrate with a titanium interlayer. For the defect studies, electron spectroscopies based on electron-positron annihilation were applied. X-ray diffraction techniques were used for both the stress determination in the diamond layer and for a phase analysis of the complete composite structure. The layer was found to contain a significant fraction of vacancy clusters and single vacancy type defects, which are probably situated within the individual grains. The presence of the larger defects may be related to a compressive stress in the layer.
Idioma original | English |
---|---|
Páginas (desde-hasta) | 215-220 |
Número de páginas | 6 |
Publicación | Radiation Effects and Defects in Solids |
Volumen | 156 |
N.º | 1 |
Estado | Published - 1 dic 2002 |
Huella dactilar
ASJC Scopus subject areas
- Radiation
- Nuclear and High Energy Physics
- Materials Science(all)
- Condensed Matter Physics
Citar esto
}
Defect studies of diamond hard coatings. / Hempel, A.; Hempel, M.; Härting, M.; Britton, D. T.; Bauer-Kugelmann, W.; Triftshäuser, W.
En: Radiation Effects and Defects in Solids, Vol. 156, N.º 1, 01.12.2002, p. 215-220.Resultado de la investigación: Article
TY - JOUR
T1 - Defect studies of diamond hard coatings
AU - Hempel, A.
AU - Hempel, M.
AU - Härting, M.
AU - Britton, D. T.
AU - Bauer-Kugelmann, W.
AU - Triftshäuser, W.
PY - 2002/12/1
Y1 - 2002/12/1
N2 - We present the results of a combined study of the defect structure and residual stress in a diamond layer, grown by PECVD on a polycrystalline copper substrate with a titanium interlayer. For the defect studies, electron spectroscopies based on electron-positron annihilation were applied. X-ray diffraction techniques were used for both the stress determination in the diamond layer and for a phase analysis of the complete composite structure. The layer was found to contain a significant fraction of vacancy clusters and single vacancy type defects, which are probably situated within the individual grains. The presence of the larger defects may be related to a compressive stress in the layer.
AB - We present the results of a combined study of the defect structure and residual stress in a diamond layer, grown by PECVD on a polycrystalline copper substrate with a titanium interlayer. For the defect studies, electron spectroscopies based on electron-positron annihilation were applied. X-ray diffraction techniques were used for both the stress determination in the diamond layer and for a phase analysis of the complete composite structure. The layer was found to contain a significant fraction of vacancy clusters and single vacancy type defects, which are probably situated within the individual grains. The presence of the larger defects may be related to a compressive stress in the layer.
KW - Defect profile
KW - Diamond
KW - Positron annihilation
KW - Residual stress
KW - X-ray diffraction
UR - http://www.scopus.com/inward/record.url?scp=2442439944&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:2442439944
VL - 156
SP - 215
EP - 220
JO - Radiation Effects and Defects in Solids
JF - Radiation Effects and Defects in Solids
SN - 1042-0150
IS - 1
ER -