Defect studies of diamond hard coatings

A. Hempel; M. Hempel; M. Härting; D. T. Britton; W. Bauer-Kugelmann; W. Triftshäuser

Defect studies of diamond hard coatings

A. Hempel, M. Hempel, M. Härting, D. T. Britton, W. Bauer-Kugelmann, W. Triftshäuser

Facultad Ciencias Exactas

Resultado de la investigación: Contribución a una revista › Artículo

Resumen

We present the results of a combined study of the defect structure and residual stress in a diamond layer, grown by PECVD on a polycrystalline copper substrate with a titanium interlayer. For the defect studies, electron spectroscopies based on electron-positron annihilation were applied. X-ray diffraction techniques were used for both the stress determination in the diamond layer and for a phase analysis of the complete composite structure. The layer was found to contain a significant fraction of vacancy clusters and single vacancy type defects, which are probably situated within the individual grains. The presence of the larger defects may be related to a compressive stress in the layer.

Idioma original	Inglés
Páginas (desde-hasta)	215-220
Número de páginas	6
Publicación	Radiation Effects and Defects in Solids
Volumen	156
N.º	1
Estado	Publicada - 1 dic 2002

Áreas temáticas de ASJC Scopus

Radiación
Física nuclear y de alta energía
Ciencia de los materiales (todo)
Física de la materia condensada

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Hempel, A., Hempel, M., Härting, M., Britton, D. T., Bauer-Kugelmann, W., & Triftshäuser, W. (2002). Defect studies of diamond hard coatings. Radiation Effects and Defects in Solids, 156(1), 215-220.

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AU - Hempel, A.

AU - Hempel, M.

AU - Härting, M.

AU - Britton, D. T.

AU - Bauer-Kugelmann, W.

AU - Triftshäuser, W.

PY - 2002/12/1

Y1 - 2002/12/1

N2 - We present the results of a combined study of the defect structure and residual stress in a diamond layer, grown by PECVD on a polycrystalline copper substrate with a titanium interlayer. For the defect studies, electron spectroscopies based on electron-positron annihilation were applied. X-ray diffraction techniques were used for both the stress determination in the diamond layer and for a phase analysis of the complete composite structure. The layer was found to contain a significant fraction of vacancy clusters and single vacancy type defects, which are probably situated within the individual grains. The presence of the larger defects may be related to a compressive stress in the layer.

AB - We present the results of a combined study of the defect structure and residual stress in a diamond layer, grown by PECVD on a polycrystalline copper substrate with a titanium interlayer. For the defect studies, electron spectroscopies based on electron-positron annihilation were applied. X-ray diffraction techniques were used for both the stress determination in the diamond layer and for a phase analysis of the complete composite structure. The layer was found to contain a significant fraction of vacancy clusters and single vacancy type defects, which are probably situated within the individual grains. The presence of the larger defects may be related to a compressive stress in the layer.

KW - Defect profile

KW - Diamond

KW - Positron annihilation

KW - Residual stress

KW - X-ray diffraction

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JO - Radiation Effects and Defects in Solids

JF - Radiation Effects and Defects in Solids

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