Analysis of Deterioration in a Plasma Focus Device

Daniel Zanelli, Enrique López, Cristian Pavez, José Pedreros, Jalaj Jain, Gonzalo Avaria, José Moreno, Biswajit Bora, Sergio Davis, Leopoldo Soto

Resultado de la investigación: Conference article

Resumen

The Plasma Focus (PF) is a kind of dense transient plasmas in with high-pulsed voltage. To produce devices for eld application it is necessary to obtain PF equipment able to operate for a long period of time. Thus, a reliability analysis is indispensable. In this work a reliability analysis program for plasma focus devices is presented. The program considers a criticality analysis using Failure Modes and Effects Criticality Analysis (FMECA) to identify the most important failure modes of the system. Said failure modes are studied operating the Plasma Focus for many cycles, obtaining from them the characteristic curves of V(t) and İ(t). Feature Extraction (FE) techniques are applied to obtain a list of parameters that correlate to the degrading process. Furthermore, Machine Learning tools are used to learn from the obtained data, linking the changes in these parameters during its life cycle to the decay of the system in hope for future implementation of a predictive maintenance system and a reference for data analysis and prediction in PFs. The study was applied to a portable plasma focus device operated at 2 joules of stored energy.

IdiomaEnglish
Número de artículo012049
PublicaciónJournal of Physics: Conference Series
Volumen1043
Número de edición1
DOI
EstadoPublished - 25 jun 2018
Evento20th Chilean Physics Symposium - Santiago, Chile
Duración: 30 nov 20162 dic 2016

Huella dactilar

plasma focus
deterioration
failure modes
reliability analysis
cycles
machine learning
pattern recognition
lists
maintenance
electric potential
decay
curves
predictions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Citar esto

Zanelli, D., López, E., Pavez, C., Pedreros, J., Jain, J., Avaria, G., ... Soto, L. (2018). Analysis of Deterioration in a Plasma Focus Device. Journal of Physics: Conference Series, 1043(1), [012049]. https://doi.org/10.1088/1742-6596/1043/1/012049
Zanelli, Daniel ; López, Enrique ; Pavez, Cristian ; Pedreros, José ; Jain, Jalaj ; Avaria, Gonzalo ; Moreno, José ; Bora, Biswajit ; Davis, Sergio ; Soto, Leopoldo. / Analysis of Deterioration in a Plasma Focus Device. En: Journal of Physics: Conference Series. 2018 ; Vol. 1043, N.º 1.
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abstract = "The Plasma Focus (PF) is a kind of dense transient plasmas in with high-pulsed voltage. To produce devices for eld application it is necessary to obtain PF equipment able to operate for a long period of time. Thus, a reliability analysis is indispensable. In this work a reliability analysis program for plasma focus devices is presented. The program considers a criticality analysis using Failure Modes and Effects Criticality Analysis (FMECA) to identify the most important failure modes of the system. Said failure modes are studied operating the Plasma Focus for many cycles, obtaining from them the characteristic curves of V(t) and İ(t). Feature Extraction (FE) techniques are applied to obtain a list of parameters that correlate to the degrading process. Furthermore, Machine Learning tools are used to learn from the obtained data, linking the changes in these parameters during its life cycle to the decay of the system in hope for future implementation of a predictive maintenance system and a reference for data analysis and prediction in PFs. The study was applied to a portable plasma focus device operated at 2 joules of stored energy.",
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Zanelli, D, López, E, Pavez, C, Pedreros, J, Jain, J, Avaria, G, Moreno, J, Bora, B, Davis, S & Soto, L 2018, 'Analysis of Deterioration in a Plasma Focus Device' Journal of Physics: Conference Series, vol. 1043, n.º 1, 012049. https://doi.org/10.1088/1742-6596/1043/1/012049

Analysis of Deterioration in a Plasma Focus Device. / Zanelli, Daniel; López, Enrique; Pavez, Cristian; Pedreros, José; Jain, Jalaj; Avaria, Gonzalo; Moreno, José; Bora, Biswajit; Davis, Sergio; Soto, Leopoldo.

En: Journal of Physics: Conference Series, Vol. 1043, N.º 1, 012049, 25.06.2018.

Resultado de la investigación: Conference article

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T1 - Analysis of Deterioration in a Plasma Focus Device

AU - Zanelli, Daniel

AU - López, Enrique

AU - Pavez, Cristian

AU - Pedreros, José

AU - Jain, Jalaj

AU - Avaria, Gonzalo

AU - Moreno, José

AU - Bora, Biswajit

AU - Davis, Sergio

AU - Soto, Leopoldo

PY - 2018/6/25

Y1 - 2018/6/25

N2 - The Plasma Focus (PF) is a kind of dense transient plasmas in with high-pulsed voltage. To produce devices for eld application it is necessary to obtain PF equipment able to operate for a long period of time. Thus, a reliability analysis is indispensable. In this work a reliability analysis program for plasma focus devices is presented. The program considers a criticality analysis using Failure Modes and Effects Criticality Analysis (FMECA) to identify the most important failure modes of the system. Said failure modes are studied operating the Plasma Focus for many cycles, obtaining from them the characteristic curves of V(t) and İ(t). Feature Extraction (FE) techniques are applied to obtain a list of parameters that correlate to the degrading process. Furthermore, Machine Learning tools are used to learn from the obtained data, linking the changes in these parameters during its life cycle to the decay of the system in hope for future implementation of a predictive maintenance system and a reference for data analysis and prediction in PFs. The study was applied to a portable plasma focus device operated at 2 joules of stored energy.

AB - The Plasma Focus (PF) is a kind of dense transient plasmas in with high-pulsed voltage. To produce devices for eld application it is necessary to obtain PF equipment able to operate for a long period of time. Thus, a reliability analysis is indispensable. In this work a reliability analysis program for plasma focus devices is presented. The program considers a criticality analysis using Failure Modes and Effects Criticality Analysis (FMECA) to identify the most important failure modes of the system. Said failure modes are studied operating the Plasma Focus for many cycles, obtaining from them the characteristic curves of V(t) and İ(t). Feature Extraction (FE) techniques are applied to obtain a list of parameters that correlate to the degrading process. Furthermore, Machine Learning tools are used to learn from the obtained data, linking the changes in these parameters during its life cycle to the decay of the system in hope for future implementation of a predictive maintenance system and a reference for data analysis and prediction in PFs. The study was applied to a portable plasma focus device operated at 2 joules of stored energy.

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Zanelli D, López E, Pavez C, Pedreros J, Jain J, Avaria G y otros. Analysis of Deterioration in a Plasma Focus Device. Journal of Physics: Conference Series. 2018 jun 25;1043(1). 012049. https://doi.org/10.1088/1742-6596/1043/1/012049