Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers

Diego P. Oyarzún, Omar E. Linarez Pérez, Manuel López Teijelo, César Zúñiga, Eduardo Jeraldo, Daniela A. Geraldo, Ramiro Arratia-Perez

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting.

Original languageEnglish
Pages (from-to)67-70
Number of pages4
JournalMaterials Letters
Volume165
DOIs
Publication statusPublished - 15 Feb 2016

Fingerprint

Confocal microscopy
Atomic force microscopy
Nanostructures
atomic force microscopy
microscopy
forks
Field emission
field emission
Tuning
tuning
Transmission electron microscopy
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy
configurations

Keywords

  • 3D confocal microscopy
  • Materials characterization
  • Thin films
  • TiO nanoporous
  • Tuning fork AFM

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Oyarzún, Diego P. ; Linarez Pérez, Omar E. ; López Teijelo, Manuel ; Zúñiga, César ; Jeraldo, Eduardo ; Geraldo, Daniela A. ; Arratia-Perez, Ramiro. / Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers. In: Materials Letters. 2016 ; Vol. 165. pp. 67-70.
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Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers. / Oyarzún, Diego P.; Linarez Pérez, Omar E.; López Teijelo, Manuel; Zúñiga, César; Jeraldo, Eduardo; Geraldo, Daniela A.; Arratia-Perez, Ramiro.

In: Materials Letters, Vol. 165, 15.02.2016, p. 67-70.

Research output: Contribution to journalArticle

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AU - Oyarzún, Diego P.

AU - Linarez Pérez, Omar E.

AU - López Teijelo, Manuel

AU - Zúñiga, César

AU - Jeraldo, Eduardo

AU - Geraldo, Daniela A.

AU - Arratia-Perez, Ramiro

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