TY - GEN
T1 - An Industrial Approach for Model-Based Reliability-Oriented System Design
AU - Morote, Juan Manuel
AU - De La Vara, Jose Luis
AU - Giachetti, Giovanni
AU - Ayora, Clara
AU - Alons, Luis
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Society increasingly depends on electronic systems and components (ECS) whose reliability must be ensured throughout their lifecycle. ECS reliability must be addressed since early development stages and the means used to this end must fit other systems engineering practices. Within this context, we present an industrial approach for model-based reliability-oriented system design. It links model-based systems engineering with Arcadia/Capella and knowledge-centric systems engineering with the Systems Engineering Suite. The approach deals with system modelling, ontology development, structured textual requirements specification, traceability management, and model quality analysis, all of them targeted at ECS reliability. We also present the validation steps taken.
AB - Society increasingly depends on electronic systems and components (ECS) whose reliability must be ensured throughout their lifecycle. ECS reliability must be addressed since early development stages and the means used to this end must fit other systems engineering practices. Within this context, we present an industrial approach for model-based reliability-oriented system design. It links model-based systems engineering with Arcadia/Capella and knowledge-centric systems engineering with the Systems Engineering Suite. The approach deals with system modelling, ontology development, structured textual requirements specification, traceability management, and model quality analysis, all of them targeted at ECS reliability. We also present the validation steps taken.
KW - Arcadia
KW - Capella
KW - knowledge-centric systems engineering
KW - model-based systems engineering
KW - reliability
KW - system design
KW - Systems Engineering Suite
UR - http://www.scopus.com/inward/record.url?scp=85147847878&partnerID=8YFLogxK
U2 - 10.1109/PRDC55274.2022.00036
DO - 10.1109/PRDC55274.2022.00036
M3 - Conference contribution
AN - SCOPUS:85147847878
T3 - Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC
SP - 224
EP - 229
BT - Proceedings - 2022 IEEE 27th Pacific Rim International Symposium on Dependable Computing, PRDC 2022
PB - IEEE Computer Society
T2 - 27th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2022
Y2 - 28 November 2022 through 1 December 2022
ER -